The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 28, 1998
Filed:
Mar. 07, 1997
Ki Chai Kim, Kyungsanbuk-do, KR;
Se Yong Ro, Kyungki-do, KR;
LG Electronics Inc., Seoul, KR;
Abstract
A measuring apparatus and method of a permittivity of a dielectric material employs a cavity and a variable reactance connected to the outside the cavity to measure the permittivity of the dielectric material, in which a power-feeding post is installed within the cavity, the variable reactance for forcibly resonating the cavity is attached to the upper portion of the cavity at the end of the power-feeding post, a network analyzer is connected to the power-feeding post, and the dielectric material specimen to be measured fills up the cavity, so that the length of the variable reactance is adjusted to forcibly resonate the cavity and, at this time, the length of the variable reactance is measured to determine the permittivity of the dielectric material. Thus, unknown permittivity is simply measured while enabling the broadband measurement. A small cavity at a cut-off state is employed to be suitable for measuring the permittivity in a low frequency band.