The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 28, 1998

Filed:

Aug. 29, 1995
Applicant:
Inventors:

Seishiro Kobayashi, Tokyo, JP;

Akiyoshi Nabei, Tokyo, JP;

Shuichi Takashina, Tokyo, JP;

Takashi Fujishiro, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J / ; G01K / ;
U.S. Cl.
CPC ...
374126 ; 374128 ; 374179 ;
Abstract

To provide a temperature measuring apparatus making it possible to automatically calculate a correction multiplier by assuming the data measured by a contact-type thermometer as a true value and always accurately measure temperature by the noncontact method in accordance with the correction multiplier. The temperature measuring apparatus comprises noncontact- and contact-type thermometers for measuring the temperature of a temperature measurement object, arithmetic means for calculating a correction multiplier for correcting an error of data measured by the noncontact-type thermometer in accordance with the data measured by the noncontact-type thermometer and a value measured by the contact-type thermometer and moreover calculating a correction value by correcting the data measured by the noncontact-type thermometer in accordance with the correction multiplier, and display means for displaying the measured value and the correction value.


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