The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 28, 1998

Filed:

Jul. 24, 1996
Applicant:
Inventors:

Mark D Beringer, Sherril, IA (US);

David P Leppert, Zwingle, IA (US);

Peter S Schulte, East Dubuque, IL (US);

Assignee:

Rite-Hite Corporation, Milwaukee, WI (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G08B / ;
U.S. Cl.
CPC ...
160 10 ; 160-3 ; 160238 ; 160274 ; 250221 ; 340545 ;
Abstract

An impact detection system for an industrial door, the system including two members that are releasably coupled to each other to move together with the door as it travels; disposed beyond the doorway opening is a radiation emitter and a radiation detector, preferably packaged together in a photoeye device, and emitting a beam of radiation; the first member carries a reflector that, when the two members are coupled, reflects the radiation back to the photoeye, and that is movable to a position wherein it does not reflect the radiation back to the photoeye in response to separation of the two members caused by the door being impacted, the change in state from 1) the radiation being reflected to the photoeye to 2) the radiation not being reflected to the photoeye thus serves as an indication that an impact on the door has occurred.


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