The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 21, 1998

Filed:

Oct. 13, 1995
Applicant:
Inventors:

Douglas C Yoon, Beverly Hills, CA (US);

Gregg D Wilensky, Venice, CA (US);

Joseph A Neuhaus, Marina del Ray, CA (US);

Narbik Manukian, Glendale, CA (US);

David C Gakenheimer, Redondo Beach, CA (US);

Assignee:

Logicon, Inc., Torrance, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K / ;
U.S. Cl.
CPC ...
382132 ; 382190 ;
Abstract

A caries detection system and method for quantifying a probability of lesions existing in tissues are presented. Digital X-ray images are segmented and further processed to generate feature statistics inputs for a neural network. The feature statistics include colinearity measurements of candidate lesions in different tissue segments. The neural network is trained by back propagation with an extensive data set of radiographs and histologic examinations and processes the statistics to determine the probability of lesions existing in the tissues.

Published as:
WO9706505A1; AU6693696A; US5742700A; EP0843862A1; JPH11510419A; EP0843862A4; EP0843862B1; DE69635711D1; DE69635711T2;

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