The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 21, 1998
Filed:
Mar. 22, 1996
Tai-Haur Kuo, Tainan, TW;
Wen-Chyi Wang, Tainan, TW;
Kuan-Dar Chen, Tainan, TW;
Jhy-Rong Chen, Tainan, TW;
Jhy-Woei Yeh, Tainan, TW;
National Science Council, Taipei, TW;
Abstract
The invention relates to a technique called 'Internal Linear Feedback (ILF)' for the stabilization of high-order sigma-delta modulators. The ILF technique involves an overload detector and a selector. Once 'overloaded' is detected by the overload detector, the selector is activated to make the modulator entering the ILF mode, in which additional internal linear feedback paths are employed to stabilize the modulator. Otherwise, the modulator operates in normal mode as a general high-order modulator.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile