The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 21, 1998
Filed:
Jun. 24, 1994
Applicant:
Inventors:
Michael M Herron, Ridgefield, CT (US);
Abigail Matteson, Ridgefield, CT (US);
Michael Supp, Waterbury, CT (US);
Assignee:
Schlumberger Technology Corporation, Ridgefield, CT (US);
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
436 25 ; 436 30 ; 436 31 ; 436161 ;
Abstract
A method and apparatus for analyzing a sample to determine its mineral composition. The invention combines X-ray diffraction with Fourier transform infrared spectroscopy to provide a complete spectrum including molecular vibrations, probed by FTIR scans and lattice spacing measured by X-ray diffraction in a single representation. This FX spectrum provides a more complete and accurate mineralogy than either of the techniques alone. In addition, new techniques for independent X-ray diffraction analysis and FTIR analysis are described.