The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 14, 1998

Filed:

Mar. 07, 1996
Applicant:
Inventor:

Masahiro Esashi, Nara, JP;

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K / ;
U.S. Cl.
CPC ...
382312 ; 382286 ;
Abstract

Provided is a digital information decoding method capable of speedily and surely reading digital information recorded as a two-dimensional pattern by giving a mark to each of matrix meshes set virtually. The two-dimensional pattern is converted into image data composed of image bits. A center position of each mesh is calculated, and a value of the image bit in the calculated center position is read as a value of the mesh. If there is a read error, at least one of first through third analyzing methods is executed to perform re-reading. According to the first analyzing method, the position to be examined is shifted by a specified amount from the center position in the mesh. According to the second analyzing method, a sum of weighted values of the image bits included in the mesh is calculated and compared with a specified threshold value. According to the third analyzing method, based on a distance between a boundary of the mesh being examined and its calculated center position, the calculated center position of the adjacent mesh is corrected to coincide with a true center position of the adjacent mesh.


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