The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 14, 1998
Filed:
Dec. 04, 1996
Sumito Ozawa, Miyanohigashi-machi, JP;
Yoshinori Hosokawa, Miyanohigashi-machi, JP;
Kozo Kashihara, Miyanohigashi-machi, JP;
Gensiro Setou, Miyanohigashi-machi, JP;
Horiba, Ltd., Kyoto, JP;
Abstract
A X-ray analyzer can generate an X-ray beam for application to a sample position during a support sample stage. An X-ray shield wall having an aperture transmissive to the X-ray beams is positioned adjacent to the supporting sample stage with a transparent film member sealingly extending across the aperture. An X-ray detector is positioned adjacent the X-ray shield wall. The upper side of the X-ray shield wall can be sealed and placed in a vacuum state or backfilled with a gas such as helium. The sample can be mounted at atmospheric pressure beneath the aperture and X-ray shield wall whereby improved transmission and detection of X-rays is achieved.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile