The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 14, 1998

Filed:

Jan. 12, 1996
Applicant:
Inventors:

Robert A Witte, Monument, CO (US);

Matthew S Holcomb, Colorado Springs, CO (US);

Assignee:

Hewlett-Packard Co., Palo Alto, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
364487 ; 364483 ; 3241 / ; 324 7619 ; 324 7624 ; 324 7628 ; 324 7638 ; 315367 ; 345134 ;
Abstract

A new sampling technique for waveform measuring instruments (including methods and circuits for implementing same) comprises the step of processing a series of digital signal samples through a decimator to extract a decimated sample value from each decimated sample interval in a series of decimated sample intervals. The series of digital signal samples is simultaneously processed through a digital peak detector to extract maximum and minimum values (peak detect sample values) from each decimated sample interval. For a given decimated sample interval, a difference between the maximum and minimum sample values for the interval is calculated. If the difference exceeds a glitch detect threshold value, the maximum and minimum sample values for the given decimated sample interval are transferred to a video sample memory. If not, the decimated sample value for the given decimated sample interval is transferred to the video sample memory.


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