The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 14, 1998

Filed:

Sep. 15, 1995
Applicant:
Inventors:

Chander M Ahuja, Plano, TX (US);

Charles C Mosher, Plano, TX (US);

Assignee:

Atlantic Richfield Company, Los Angeles, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
364321 ;
Abstract

A method and system for interactively applying wavelet transform and filter operations to digital data corresponding to geological measurements is disclosed. The disclosed system and method provides the capability of applying sequences of wavelet transform filter operations to input signal datasets representative of the measurements, where the wavelet transforms can utilize different scale-wavelet function pairs within the sequence. Interactive filtering is available within each wavelet transform-filter operation, allowing either manual filtering of selected level and bands, or automatic filtering through application of a filter function. Multiple wavelet transform-filter operations may be applied to the same filtered datasets, to facilitate comparison of the various analysis techniques.


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