The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 14, 1998

Filed:

Oct. 17, 1995
Applicant:
Inventor:

Katsuyuki Abe, Hachioji, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B / ;
U.S. Cl.
CPC ...
359660 ; 359657 ; 359658 ;
Abstract

A microscope objective lens system comprising a first lens unit which comprises a positive meniscus lens component having a concave surface on the object side and has a positive refractive power, a second lens unit which comprises a diverging cemented surface and has a positive refractive power, a third lens unit which comprises surfaces having strongly diverging functions and has a negative refractive power, and a fourth lens unit which has a negative refractive power; and configured so as to allow the second lens unit to be moved relatively to the first lens unit and the third lens unit in conjunction with thickness of a transparent plane parallel plate disposed between a surface of an object to be observed and the first lens unit, thereby correcting variations of aberrations caused due to changes in thickness of plane parallel plates.


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