The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 14, 1998
Filed:
Nov. 14, 1996
Applicant:
Inventors:
Shuzo Sudo, Tokyo, JP;
Kunio Nakajima, Tokyo, JP;
Assignee:
Seiko Instruments Inc., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G21K / ; H01J / ;
U.S. Cl.
CPC ...
2504831 ; 250368 ;
Abstract
An X-ray analyzing apparatus having high sensitivity and high position resolving power in which an X-ray fluorescent screen made of Gd.sub.2 O.sub.2 S:Tb as a material and having a surface density ranging from 5 mg/cm.sup.2 to 30 mg/cm.sup.2 is used, and an image intensifier and a charge coupled device (CCD) are combined to form an X-ray difraction two-dimensional detector; and the image intensifier and the CCD are combined with a tapered fiber plate, and an alignment section of a mirror mount tube and a vacuum flexible tube are separated by an X-ray window ambient atmsophere and a vacuum.