The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 14, 1998

Filed:

Dec. 21, 1995
Applicant:
Inventors:

Heinz W Siesler, Essen, DE;

Ursula Eschenauer, Baltimore, MD (US);

Assignee:

Perstorp Analytical, Inc., Silver Spring, MD (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
2503418 ; 25033911 ;
Abstract

In a near infrared absorbance measurement instrument, an attenuated internal reflectance probe comprises a quartz rod having an inexpensive low purity central core surrounded by two high purity quartz layers. Narrow band infrared light is transmitted axially through the outer layer to cause the light to undergo total internal reflection from the inner and outer surfaces of the outer layer. A near infrared light detector measures the light transmitted through the outer layer to obtain a measurement of the absorbance of the fluid in contact with the outer surface of the outer layer without any interference from suspended particles or bubbles in the fluid being measured.


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