The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 14, 1998
Filed:
Feb. 07, 1997
Richard Saylor, Lake Hopatcong, NJ (US);
HE Holdings, Inc., Los Angeles, CA (US);
Abstract
A signal processing in the element (SPRITE) thermal imaging system (20) is provided which has automatic gain control, level control, and delining. An array of SPRITE detectors (22) generate a plurality of analog signals which are proportional to the flux of infrared light received by each of the detectors (22). A digital scan converter (137) processes the analog signals and generates a resultant digital output (188) which contains digital image data for image production. A first plurality of sample-servo control loops (278, 280, 282, 284) provides automatic gain control using the digital output (188) and a second plurality of sample-servo control loops (286, 288, 290, 292) provides automatic level control using the digital output (188). A deliner is provided for normalizing differences which result from variations between detectors (22). The deliner normalizes the differences by utilizing one pair of the first and second sample-servo control loops as a reference pair (236) to provide gain and level references to the other pairs of the first (278, 280, 282) and second (286, 288, 290) sample-servo control loops.