The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 07, 1998

Filed:

May. 23, 1996
Applicant:
Inventors:

David L Kaplan, Mercer Island, WA (US);

Andrew R Miller, Bellevue, WA (US);

Andrew McRae Warden, Bellevue, WA (US);

Assignee:

Microsoft Corporation, Redmond, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
395601 ; 395602 ; 395603 ;
Abstract

A database view generation system for viewing a result set of data extracted from a database by a query. The database view generation system includes selecting a viewpoint from among at least one field set record source of a database sub-schema and generating a view of the result set in at least one level from a perspective of the viewpoint. Generating a view from a viewpoint includes analyzing the sub-schema for connectedness, identifying the sub-schema type, assigning a level indicator value that is indicative of the hierarchical position of record sources in the sub-schema relative to the viewpoint, and displaying a view of the result set based on the level indicator value assigned to each record source containing data in the result set.


Find Patent Forward Citations

Kaplan, David. (1998). Database view generation system (U.S. Patent No. 5737591). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5737591

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…