The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 07, 1998
Filed:
Feb. 08, 1996
Toshihiko Horiuchi, Ushiku, JP;
Hiroaki Kasai, Ibaraki-ken, JP;
Masaki Kurihara, Tsuchiura, JP;
Takao Konno, Ibaraki-ken, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
A shaking test system for testing a structure including a shaking device for shaking the structure, measuring devices mounted on the shaking device for shaking the structure, external signal input device for inputting data indicative of external force for shaking the structure, as well as other calculating arrangements. The shaking test system permits the setting of a large time interval of a shaking test by converting natural modes of vibration expressed by a second-order differential equation, namely second-order lag system of a vibration differential equation into a first-order lag system or (O)th order lag system for short period mode.