The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 07, 1998
Filed:
Feb. 08, 1996
Robert Maziasz, Austin, TX (US);
Mohankumar Guruswamy, Austin, TX (US);
Daniel W Dulitz, Austin, TX (US);
David Blaauw, Austin, TX (US);
Larry Jones, Austin, TX (US);
Motorola, Inc., Schaumburg, IL (US);
Abstract
The present invention relates to a method (100, 150, 200) and associated data processing system (250) for determining a standard cell height within an integrated circuit design. A plurality of cell types, each cell type including a plurality of cell structures are received (102). Then, weighting values are received, one for each cell type (104). Expected intercell connection densities are preferably also received. Various target cell heights are processed with the plurality of cell types, the weighting values, and the expected intercell connection densities to generate a standard cell height (106). The standard cell height used with the integrated circuit design produces an optimized integrated circuit area, preferably a minimum area. The present invention includes a method (200) and system (250) for selecting an optimized standard cell height that, when used with a place-and-route tool to generate a physical design file (204) produces an optimized physical integrated circuit design. A method of manufacture (300) is also included.