The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 07, 1998
Filed:
Jun. 03, 1996
Applicant:
Inventors:
Masayuki Nashiki, Aichi, JP;
Atsushi Ieki, Aichi, JP;
Assignee:
Okuma Corporation, Aichi, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01C / ;
U.S. Cl.
CPC ...
356-513 ; 356-41 ; 356-409 ;
Abstract
A position detecting apparatus utilizing optical interferometry changes the wavelength of a light beam from the light source. The variation in the wavelength causes an increment and decrement Cx, Co in the number of waves in the measurement and reference lengths Lx, Lo. The position data calculating section calculates the measurement length Lx on the basis of the detected increment and decrement Cx, Co and the reference length Lo according to an equation, Lx=Lo(Cx/Co). The position detecting apparatus can easily detect an absolute position of an object to be detected.