Semiconductor device and test method for connection between

Abstract

The invention provides a semiconductor device capable of switching drive powers of an output buffer thereof smaller than that for an ordinary operation for detecting even a slight short caused when a component is lying on a wiring pattern, thereby preventing damage of the device in the test even when the wiring pattern between the devices are short-circuited, and further provides a semiconductor device capable of switching drive powers of an output buffer thereof larger than that for an ordinary operation for surely detecting a short between a connection series including the above-mentioned semiconductor device and another connection series including a semiconductor device only having drive powers for the ordinary operation. The invention also provides a method for testing a connection between semiconductor devices capable of surely detecting a short between at least two connection series even on a board where a connection series is included with a conventional semiconductor device only having a drive power for the ordinary operation being mixed, by means of disposing a semiconductor device capable of switching drive powers of an output buffer in at least two levels in another connection series in the upper stream of the current flow, and switching the drive powers of the device to be larger or smaller.