The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 07, 1998

Filed:

May. 13, 1996
Applicant:
Inventors:

Shinichi Tamura, Kawasaki, JP;

Youichi Tei, Kawasaki, JP;

Naoki Itoh, Kawasaki, JP;

Kazumi Egota, Kawasaki, JP;

Kenichi Ohkura, Kawasaki, JP;

Assignee:

Fuji Electric Co., Ltd., Kanagawa, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03G / ;
U.S. Cl.
CPC ...
430 59 ; 430 58 ; 430 78 ; 430 83 ;
Abstract

An electrophotographic photoreceptor includes a conductive substrate and a photosensitive layer including a charge generation material and a charge transport material. The charge generation material is a titanyloxyphthalocyanine crystal having a maximum diffraction intensity observed at Bragg angle (2.theta.) of 9.6.degree..+-.0.2.degree. and clear peaks of diffraction intensity observed at 7.22.degree..+-.0.2.degree., 9.60.degree..+-.0.2.degree., 11.60.degree..+-.0.2.degree., 13.40.degree..+-.0.2.degree., 14.88.degree..+-.0.2.degree., 18.34.degree..+-.0.2.degree., 23.62.degree..+-.0.2.degree., 24.14.degree..+-.0.2.degree., and 27.32.degree..+-.0.2.degree., respectively, in a X-ray diffraction spectrum obtained by performing a X-ray diffraction method using CuK.alpha. as a source of radiation, and having a lattice constant of:


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