The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 07, 1998
Filed:
Jul. 03, 1996
Kimiyo Shibata, Kakogawa, JP;
Yoshihiro Mishima, Kobe, JP;
Toa Medical Electronics Co. Ltd., Hyogo, JP;
Abstract
An apparatus and method for analyzing particles includes a distribution data preparation device for measuring parameters that characterize particles contained in a specimen and for preparing a distribution data of the particles in a coordinate space based on the parameters, a judgement region storage device for storing in advance a predetermined judgement region in the coordinate space, a base point extraction device for extracting, when the distribution data forms at least one group, a group base point that shows a position of the group, a judgement region correction device for correcting a position of the judgement region in the coordinate space by referring to each group base point extracted every time a distribution data is prepared by the distribution data preparation device, and a judgement device for judging the specimen based on the particles present within the corrected judgement region.