The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 31, 1998
Filed:
Sep. 15, 1995
Teruo Asaeda, Tokyo, JP;
Kazunori Nousou, Yokohama, JP;
Masanori Imanisi, Tokyo, JP;
Yutaka Suzuki, Zama, JP;
Sachiyo Katabami, Yokosuka, JP;
Nissan Motor Co., Ltd., Kanagawa, JP;
Abstract
In order to reliably detect a defect on an inspected surface, electronic pictures of the inspected surface are formed at different positions by moving an imaging area relative to the inspected surface. Defect candidate regions are extracted from a series of the pictures. The system examines whether a movement from one candidate region to another candidate region is proportional to the movement of the imaging area. If the movement between the candidate regions is in proportion to the movement of the imaging area, the system judges that the candidate regions are imagery of a defect on the inspected surface.