The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 31, 1998

Filed:

Dec. 16, 1996
Applicant:
Inventors:

Nobuyuki Yano, deceased, late of Okazaki, JP;

Katsuyasu Mizuno, Gamagori, JP;

Assignee:

Nidek Company, Ltd., Gamagori, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B / ; G02B / ;
U.S. Cl.
CPC ...
359368 ; 359227 ; 359236 ; 359388 ;
Abstract

A confocal scanning microscope comprises rotational disk having numerous pinholes arranged at positions that are conjugate with respect to an object to be observed, illumination optical system for implementing the pinhole-illumination for the object to be observed through the rotational disk, and observation optical system for conducting a reflected light beam from the illuminated object to be observed through the rotational disk and focuses the light beam to form an image for observation at a position that is conjugate with respect to the rotational disk, wherein the pinholes of the rotational disk are in equiangular arrangement on a parabolic spiral. The number of loops M of the parabolic spiral and the number of equiangular divisions in one round of the parabolic spiral at which the pinholes are located have any of relations: M:N=1:2, 3:2, 5:2, . . . , (2i-1):2, where i is an integer.


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