The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 31, 1998
Filed:
Jun. 01, 1995
Applicant:
Inventor:
James M Buchanan, Austin, TX (US);
Assignee:
Advanced Micro Devices, Inc., Sunnyvale, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
324754 ; 324755 ;
Abstract
A method for testing of an integrated circuit of a semiconductor device which is packaged in a housing with leads projecting from the housing and contact elements, other than leads, disposed along one or more of the surfaces of the housing is disclosed. A plurality of decoupling capacitors are mounted on a printed circuit board and disposed for being temporarily connected to the contact elements during testing of the integrated circuit at an automatic handler test station, wherein a test environment is created which closely approximates a real operating environment of the integrated circuit.