The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 31, 1998
Filed:
Mar. 25, 1996
Applicant:
Inventors:
Paul R Kraus, Boilingbrook, IL (US);
Robert D McClain, Sugar Land, TX (US);
Michael K Poindexter, Sugar Land, TX (US);
Assignee:
Nalco/Exxon Energy Chemicals, L.P., Sugar Land, TX (US);
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
73 6162 ;
Abstract
Thickness-shear mode resonators which simultaneously measure mass deposition and fluid properties can be utilized to monitor petroleum processing, petrochemical and water treatment systems. Specialty chemical additive materials can be accurately and instantaneously added to control conditions detected by the thickness-shear mode resonators. The thickness-shear mode resonators are piezoelectric crystals used in conjunction with oscillator circuitry that can determine mass as well as viscosity and/or density of a fluid in contact with the piezoelectric surface.