The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 31, 1998

Filed:

Oct. 15, 1996
Applicant:
Inventors:

Pranab K Raychaudhuri, Rochester, NY (US);

Fridrich Vazan, Pittsford, NY (US);

George R Olin, Webster, NY (US);

Yuan-Sheng Tyan, Webster, NY (US);

Assignee:

Eastman Kodak Company, Rochester, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B32D / ;
U.S. Cl.
CPC ...
428 641 ; 428 642 ; 428 644 ; 428 645 ; 428 646 ; 428457 ; 428913 ; 43027011 ; 4304951 ; 430945 ; 369283 ; 369288 ;
Abstract

A recordable element with improved performance, and a method of making such element is disclosed. The recordable element includes a substrate and an optical recording layer deposited on the substrate, wherein the optical recording layer is formed of Te.sub.a Ge.sub.b C.sub.c H.sub.d O.sub.e where a, b, c, d, and e are atomic percents such that a+b+c+d+e=100, and wherein 10<a<40, 10<b<60, 5<c<35, and 15<(c+d)<65 and e.gtoreq.0; a metal layer over the optical recording layer; and the recording element having its properties changed by heat treatment for a time and temperature selected so as to significantly improve jitter, window margin, reflectivity, and recording sensitivity performance.


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