The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 31, 1998

Filed:

Jan. 23, 1996
Applicant:
Inventors:

David P Ramer, Dayton, OH (US);

Harold E Watson, Kettering, OH (US);

Michael P Ritter, Dayton, OH (US);

Bobby L Epling, Bellbrook, OH (US);

Mark G Schmitt, Huber Heights, OH (US);

Jack C Rains, Jr, Herndon, VA (US);

Assignee:

Advanced Optical Technologies, LLC., Chevy Chase, MD (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
F21V / ;
U.S. Cl.
CPC ...
362 32 ; 362301 ; 362302 ; 362346 ;
Abstract

Apparatus is disclosed that efficiently projects electromagnetic radiation over a predetermined spherical sector with a tailored intensity distribution. The apparatus includes a base having a cavity and aperture that faces the spherical sector to be illuminated, with a flat, ring-shaped shoulder surrounding the aperture. The apparatus further includes a mask spaced over the aperture and a baffle projecting from the mask toward the aperture. The base, the mask, and the baffle are formed of a material having an outer surface with a significant diffuse, reflective characteristic. A source emits electromagnetic radiation (e.g., visible light) into the base cavity, and the base, mask and baffle are configured to redirect this radiation outwardly with the tailored intensity distribution (e.g., a uniform distribution) over the predetermined spherical sector (e.g., a hemisphere, or 2.PI. steradians).


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