The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 24, 1998

Filed:

Sep. 19, 1995
Applicant:
Inventors:

Ruixia Zhou, Salt Lake City, UT (US);

Elizabeth H Hammond, Salt Lake City, UT (US);

Dennis L Parker, Centerville, UT (US);

Assignee:

IHC Health Services, Inc., Salt Lake City, UT (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K / ;
U.S. Cl.
CPC ...
382133 ; 2504612 ; 382164 ;
Abstract

A method and system for segmenting images of samples stained with two, three, or more stains accurately and reliably into multiple single-color images which represent the mass density of the stain at each position in the sample. The system includes a computer-controlled microscope and CCD camera, and at least one computer which includes data storage media for storing image data and which runs software for controlling image acquisition and analysis. To analyze tissue stained with N stains, images must be obtained at N different wavelengths, from multiply stained and singly stained samples. Relative stain mass densities are calculated with the use of the ratio of absorptivities measured at different wavelengths. The theoretical and practical basis for implementing the method with two, three, or more stains is presented. A method for selecting the wavelengths which provide optimal image accuracy and resolution is also provided.


Find Patent Forward Citations

Zhou, Ruixia. (1998). Method and system for multiple wavelength microscopy image analysis (U.S. Patent No. 5732150). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5732150

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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