The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 24, 1998
Filed:
May. 08, 1996
Panu Kopsala, Tuusula, FI;
Instrumentarium Corporation, Helsinki, FI;
Abstract
The invention relates to a method for the automatic adjustment of exposure parameters in an imaging apparatus operating on linear tomographic principles and intended for the slice imaging of the region of denture and temporomandibular joints. The method includes a stage for measuring a radiation (8) transmitted through the skull and for adjusting exposure parameters on the basis of the measuring result. According to the invention, a first imaging sequence, at the start of which the exposure parameters are adjusted, is commenced from such a direction (11a, 11b) that the passage of radiation is secured through thick skull portions and that a subsequent imaging sequence in a direction (12-17) other than the previous direction is carried out by varying the exposure parameters programmatically by a predetermined deviation or by effecting the automatic adjustment of exposure parameters on the basis of new measuring results, whose starting parameters have been obtained by varying the exposure parameters programmatically by a predetermined deviation.