The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 24, 1998
Filed:
Sep. 19, 1996
Applicant:
Inventors:
Hee-Choul Park, Kyungki-do, KR;
Kook-Hwan Kwon, Kyungki-do, KR;
Assignee:
Samsung Electronics Co., Ltd., Suwon, KR;
Primary Examiner:
Int. Cl.
CPC ...
G11C / ;
U.S. Cl.
CPC ...
365201 ; 365194 ;
Abstract
A burn-in test circuit for a semiconductor memory device tests for defective memory cells. The test circuit applies a test signal that turns 'off' transistors in a precharge circuit and applies a select signal to memory cells at predetermined intervals. The select signal and test signal are delayed for different time intervals depending on whether the memory device is transitioning from a normal operating mode to a test mode or from the test mode to the normal operating mode. The selective delay prevents overcurrent conditions from occurring during the mode transitions.