The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 24, 1998
Filed:
Apr. 25, 1996
Advance Vision Technology (A.V.T.) Ltd., Herzlia, IL;
Abstract
A method and a device for evaluating a printing process, which can be used for determining a measurement to be exercised for controlling the printing process. The method comprising the steps of calculating a multidimensional data representation of a reference image, and clustering the multidimensional data representation into at least one cluster of data according to at least one multidimensional clustering algorithm. The device comprising calculating means for calculating a multidimensional data representation of a reference image and clustering means for clustering the multidimensional data representation into at least one cluster of data according to at least one multidimensional clustering algorithm. Each of the clusters of data serves for determining at least one feature of measurement of the reference image. The features of measurement serve for selecting at least one type of physical measurement to be performed on a printed image. Whereas, the physical measurements serve for a color based control of the printing process of the printed image.