The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 24, 1998

Filed:

Apr. 11, 1996
Applicant:
Inventors:

Takaoki Namba, Sayama, JP;

Masaaki Kubota, Sayama, JP;

Soichi Yamamoto, Sayama, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ; G06G / ; G06G / ;
U.S. Cl.
CPC ...
36447424 ; 36446824 ; 36447201 ; 36447431 ; 364191 ;
Abstract

Finishing allowances are given to a structure by a CAD/CAM system, and cutter path data for machining the finishing allowances are simultaneously generated. A surface finish is indicated on a die structure by a finishing mark. Finishing allowances are given to the die structure, producing a die structure with finishing allowances. Thereafter, a physical interference is confirmed on a screen image in order to generate cutter path data for a cutter head with respect to the die structure. If an interference occurs, the operator replaces a cutter with a longer cutter, and confirms again a physical interference. Cutter path data with respect to the die structure with finishing allowances can be generated substantially automatically.


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