The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 24, 1998
Filed:
Sep. 26, 1996
Wen Yaung Lee, San Jose, CA (US);
Daniele Mauri, San Jose, CA (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
An MR sensor with an improved MR coefficient and improved thermal stability is provided by employing one or more chromium based spacer layers which are interfacially adjacent a Permalloy (NiFe) stripe. The chromium based spacer layers may be NiFeCr or NiCr. The best compositions have been found to be (Ni.sub.89 Fe.sub.21).sub.60 Cr.sub.40 and Ni.sub.60 Cr.sub.40. For NiCr the MR coefficient of the MR stripe is most enhanced when the NiCr layer is deposited on a layer of tantalum (Ta). Further, when the thicknesses of the NiFeCr and the NiCr layers are 25 .ANG. and 50 .ANG. respectively the MR coefficients are optimized. Both spacer layers have a high resistance compatible with low shunting of the sense current.