The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 24, 1998
Filed:
Dec. 19, 1995
Leo Gross, New York, NY (US);
Other;
Abstract
A multi-purpose objective for use in a compound microscope wherein the microscope has an eyepiece and a multi-purpose processing element in the back focal plane or Fourier plane of the objective and an aperture or slit for the light source situated in the front focal plane or conjugate Fourier plane of the condenser. An aperture specimen stage is disposed between the condenser and objective lenses. The multi-purpose light processing element has a plurality of light processing regions upon a selected region of which the image of the aperture slit is formed. The aperture element is moveable relative to the multi-purpose light processing element so as to direct light onto the selected region of the multi-purpose processing element. By directing the light illuminating the specimen onto the selected area of the multi-processing plate or element, the image selected of the specimen can be viewed in any mode such as, phase contrast, modulation contrast, colored images similar to a differential interference contrast, bright field images, dark field images and stereo imagery.