The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 24, 1998

Filed:

Dec. 09, 1994
Applicant:
Inventors:

Jong-Sool Jeong, Seoul, KR;

Chong-Hoon Kwak, Daejeon, KR;

El-Hang Lee, Daejeon, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
359258 ; 359584 ; 359578 ;
Abstract

A wavelength division demultiplexing device, and a system using the device are disclosed, in which there is utilized a Pabry-Perot etalon using as a spacer layer a Kerr medium in which the refractive index is varied in accordance with the intensity of beams. The wavelength division demultiplexing device according to the present invention includes: a substrate; a first mirror layer formed on the substrate, and consisting of an alternately repeating medium used as a bottom mirror layer; a second mirror layer consisting of an alternating repeating stack of a high refractive index medium and a low refractive index medium used as a top mirror layer; and a spacer layer composed of a Kerr medium and disposed between the first mirror layer and the second mirror layer; wherein the reflectivity of the first mirror layer is higher than that of the second mirror layer; and the thickness of the spacer layer is set such that the value of the initial tuning phase of the spacer layer for the range of wavelengths of an incident beam is m.pi.+t.pi., where m represents an integer, and t represents 0.2-0.4.


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