The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 24, 1998

Filed:

Sep. 19, 1996
Applicant:
Inventors:

Guenter Schnur, Hemhofen, DE;

Claude Reymond, Petit-Laney, CH;

Pascal Sommer, Meyrin Geneve, CH;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V / ;
U.S. Cl.
CPC ...
324320 ; 324319 ;
Abstract

Two MR magnetic field probes arranged in a centrally symmetrical fashion in relation to the magnetic field center, are attached in the examination area of the magnet. The output signals of the two MR magnetic field probes are supplied to a multiplying RF mixer, and a sum frequency signal is obtained from the output signal of the RF mixer, and the actual value of the basic field is determined from the frequency of this output signal.


Find Patent Forward Citations

Schnur, Guenter. (1998). Method and arrangement for measuring and controlling the basic field of (U.S. Patent No. 5731704). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5731704

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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