The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 24, 1998

Filed:

Oct. 13, 1995
Applicant:
Inventors:

Michael T Lanagan, Woodridge, IL (US);

David S Kupperman, Oak Park, IL (US);

George A Yaconi, Berwyn, IL (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
73632 ; 73597 ; 73602 ;
Abstract

A method and an apparatus for nondestructive detecting and evaluating chas in the microstructural properties of a material by employing one or more magnetostrictive transducers linked to the material by means of one or more sonic signal conductors. The magnetostrictive transducer or transducers are connected to a pulser/receiver which in turn is connected to an oscilloscope. The oscilloscope is connected to a computer which employs an algorithm to evaluate changes in the velocity of a signal transmitted to the material sample as function of time and temperature.


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