The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 24, 1998

Filed:

Jan. 15, 1997
Applicant:
Inventors:

David P Banks, Lake Stevens, WA (US);

James N Buttrick, Jr, Seattle, WA (US);

Paul E Ffield, Marysville, WA (US);

Assignee:

The Boeing Company, Seattle, WA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
335441 ; 33544 ;
Abstract

An automated hole inspection system for measuring, on a plurality of planes, the diameter of a hole in a workpiece includes a hole gauge for measurement of a hole diameter in one plane, and a remote centering compliance device connected to the proximal end of the probe for allowing the probe to move laterally, perpendicularly to the probe axis, to self-center in the hole. A center locking device locks the remote centering compliance device on the axis of the probe after the probe has self-centered in the hole. A rotary actuator rotates the remote centering compliance device to rotate the probe to a new desired plane for making an additional diameter measurement in the hole.


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