The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 17, 1998
Filed:
Jul. 31, 1995
Robert Han Wu, Austin, TX (US);
Jerome A Gerner, Pflugerville, TX (US);
Richard A Wheelus, Austin, TX (US);
Motorola Inc., Schaumburg, IL (US);
Abstract
Content testing (302-306) and comparator testing (312-326) of a tag section (24, 26) of a cache tag memory array is performed to confirm that the tag section (24, 26) is functional. For content testing (302-306), each tag location is tested once. Comparator testing (312-326) is performed to determine the functionality of the comparator (240, 260) of the cache tag memory array. The number of tests performed for the comparator testing is 2.times.M+2, where M is the number of bit positions in the tag location. Two of the tests are for testing the comparator's ability to identify correctly hits within the tag section (312-316). The other tests are for testing the comparator's ability to identify correctly misses within the tag section at each bit position of the tag locations (322-326).