The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 17, 1998
Filed:
Oct. 16, 1996
Alessandro Chiabrera, 16145 Genoa, IT;
Bruno Bianco, 16122 Genoa, IT;
Jonathan J Kaufman, Bklyn, NY (US);
Other;
Abstract
An unknown object is non-destructively and quantitatively evaluated for three-dimensional spatial distribution of a set of material constitutive parameters of the unknown object, using a multi-element array-source transducer and a multi-element array-detector transducer located near the unknown object. The array-source transducer exposes the array-detector transducer to a set of source-field patterns pursuant to a set of electrical input signals. An unknown object located near these transducers will be the cause of scattering, thus presenting a scattered-field pattern to the array detector transducer, for each pattern of the set of source-field patterns. In a related computation, a set of training signals is determined by evaluating on a computer the scattered field from a set of computer simulated training objects. A computer, a signal processor and a neural network operate from detector response to the computer simulated and unknown object scattered-field patterns, in each of two modes. In an initial mode, the neural network is 'trained' or configured to process a set of transfer functions involved in array-detector response to scattered-field patterns evaluated by computer simulations for the known computer simulated objects; in another mode, the neural network utilizes its 'trained' configuration in application to a set of transfer functions involved in array-detector response to scattered-field patterns produced by an unknown object, to generate estimates of the three-dimensional spatial distribution of the material constitutive parameters of the unknown object. In another embodiment, a set of the Biot poro-elastic material parameters of an unknown object is estimated.