The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 17, 1998

Filed:

Oct. 01, 1996
Applicant:
Inventors:

Duncan Weir, Fort Collins, CO (US);

Russell C Brockmann, Fort Collins, CO (US);

Assignee:

Hewlett-Packard Co., Palo Alto, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
371 27 ; 39518307 ;
Abstract

Presented is a computer-based test system and method for generating and improving the effectiveness of test cases for a model or an implementation of a computer architecture. The system includes an architectural model configured to model the requirements of the computer architecture and a behavior model configured to model the implementation of the computer architecture, wherein the behavioral model is designed to conform with the computer architecture. Further included is a simulator configured to simulate the operation of the behavioral model in response to a test pattern and to provide a behavioral model state. A random test generator is configured to test aspects of the architectural model and to generate and provide test patterns to the simulator according to the behavioral model state provided by the simulator. The random test generator provides the ability to store a pre-simulation behavioral model state and reset the simulator to the pre-simulation behavioral model state at a later time. The system may further include a history of previous events from which the rate at which an event occurs may be controlled.


Find Patent Forward Citations

Weir, Duncan. (1998). Speculative execution of test patterns in a random test generator (U.S. Patent No. 5729554). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5729554

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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