The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 17, 1998
Filed:
Sep. 21, 1995
Jurgen Klicker, Hoisdorf, DE;
Basler GmbH, Ahrensburg, DE;
Abstract
The invention pertains to a method and a device for carrying out the quality control of an object (10) that comprises at least one transparent layer (18). According to this method and this device, at least one light beam (41) of a light source (42) is projected onto the object (10) at an angle (.alpha.) and is received by at least one photosensitive receiver (53). According to the invention, it is proposed that the light beam (48) that emerges from the object be split before it is projected onto the first photosensitive receiver (53), with part of the light beam being deflected in the direction toward a second photosensitive receiver (62). This measure makes it possible to expose simultaneously two different photosensitive receivers (53, 62) so as to display different defects of an object (10).