The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 17, 1998
Filed:
May. 15, 1996
John T Pugaczewski, White Bear Lake, MN (US);
U S West, Inc., Englewood, CO (US);
Abstract
A non-intrusive test method for monitoring the performance of an optical communications system generates a parallel electrical signal corresponding to a transmitted or received optical signal without the use of a signal attenuating beam splitter or other device having optical loss by deriving the parallel electrical signal from a modulated electrical signal associated with the generation or detection of the optical signal, or from stray light generated by the optical light source. An ATM module containing a plurality of transmit and receive cables connects selected parallel electrical signals corresponding to selected optical cables to a limited number of test jacks employing a multiplexer which may be computer controlled. The non-intrusive test method allows maximal optical cable range.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile