The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 17, 1998
Filed:
Dec. 02, 1996
Applicant:
Inventors:
Michio Komoda, Itami, JP;
Yoshio Inoue, Itami, JP;
Assignee:
Mitsubishi Denki Kabushiki Kaisha, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
3241581 ;
Abstract
A master slice LSI with fault detection circuitry includes a packed transistor area consisting of rows of semiconductor devices packed on a substrate. Parts of the rows are used for providing an application specific integrated circuit (ASIC). Remaining parts of the rows are used for providing fault detection circuitry for finding faulty semiconductor devices. The fault detection circuitry includes shift registers, sense amplifiers, and a decoder. The detection circuitry is provided only for those rows of semiconductor devices used for providing the intended purpose ASIC.