The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 17, 1998

Filed:

May. 08, 1996
Applicant:
Inventors:

Toshimitsu Musha, Machida-shi, Tokyo, JP;

Yuichi Yanai, Okazaki, JP;

Shoji Takagi, Okazaki, JP;

Shu Ono, Okazaki, JP;

Assignees:

Nisshinbo Industries Inc., Tokyo, JP;

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
D03D / ; D03D / ;
U.S. Cl.
CPC ...
139 551 ; 1393 / ; 139416 ;
Abstract

A weaving method that imparts a correlation of a 1/f fluctuation to the texture pattern of a woven fabric by passing warp yarns through a plural number of healds in a specific numerical sequence. The healds are then manipulated to separate the warp yarns into two sets to form a shed therebetween through which a weft yarn is inserted. For one texture pattern, warp yarns are threaded in groups in numbers corresponding to the values of a numerical sequence with a 1/f fluctuation through one set of healds. For another texture pattern, warp yarns are threaded in groups through another set of healds so as to alternate with the first groups, thereby weaving a plural number of texture patterns into the woven goods, with the overall texture design having a 1/f fluctuation.


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