The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 10, 1998

Filed:

Oct. 20, 1995
Applicant:
Inventors:

Dao-Long Chen, Fort Collins, CO (US);

Robert D Waldron, Fort Collins, CO (US);

Khanh C Nguyen, Whitehall, PA (US);

Assignees:

AT&T Global Information Solutions Company, Dayton, OH (US);

Hyundai Electronics America, San Jose, CA (US);

Symbios Logic Inc., Fort Collins, CO (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
371-51 ;
Abstract

A data communication method and apparatus includes an integral bit error rate test system. The system is adapted to receive digital data signals to be transmitted over a communication link and includes a transmitter for transmitting the data signals onto the link. A test signal pattern generator generates a determinable pattern of digital bit test signals which are insertable into an input of the transmitter in place of the digital data signals. A receiver is coupled to the link for receiving the bit test signals and for comparing the received pattern of the bit test signals to the determinable pattern. The bit error rate is computed from the number of bit differences between the transmitted test signals and the determinable pattern.


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