The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 10, 1998
Filed:
Oct. 17, 1995
Kenneth E Prager, Folsom, CA (US);
Robby Mauri, Hawthorne, CA (US);
Hughes Aircraft Company, Los Angeles, CA (US);
Abstract
An automated system and method for testing a sensor by evaluating the output thereof with respect to a known target. The advantageous method includes the step of acquiring an output signal from the sensor in response to a known target, said output including signature signal S, random noise N.sub.R and fixed pattern noise N.sub.FP. Next, the sensor output signal is processed to provide a first signal which includes essentially signature signal S and fixed pattern noise N.sub.FP, a second signal which includes essentially random noise N.sub.R and a third signal which includes essentially fixed pattern noise N.sub.FP. The third signal is adaptively filtered to provide a filtered signal fixed pattern noise signal N'.sub.FP. The filtered signal N'.sub.FP is subtracted from the first signal to extract a signature S. In a particular embodiment, the signature is processed to acquire a modulation transfer function and a signal peak baseline therefrom. The modulation transfer function, signal peak baseline and random noise signals are processed to acquire a minimum resolvable temperature of said sensor.