The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 10, 1998
Filed:
Jul. 31, 1995
David L Davidson, San Antonio, TX (US);
Steven B Seida, San Antonio, TX (US);
Southwest Research Institute, San Antonio, TX (US);
Abstract
A method for measuring strain in a sample of material. A reference image is obtained of a surface of the sample. A test machine is used to apply a load to the sample, as determined by a control signal from a system processor. A measurement image is then obtained, and test points on the reference image are located on the measurement image, using an image processor programmed to perform machine vision. The displacements between the location of the test points on the two images are determined. These displacements are used to calculate strain. Each new strain value may be used by the system processor to determine a next load value, so that the load is adjusted in terms of strain parameters.