The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 10, 1998

Filed:

Aug. 29, 1996
Applicant:
Inventors:

Ji Jia, Salt Lake City, UT (US);

Elaine Cohen, Salt Lake City, UT (US);

Samuel H Drake, Salt Lake City, UT (US);

Russell D Fish, Salt Lake City, UT (US);

Assignee:

University of Utah Research Foundation, Salt Lake City, UT (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ; G06G / ;
U.S. Cl.
CPC ...
36447429 ; 36447424 ; 395578 ; 395133 ; 395105 ; 395 87 ; 3185 / ;
Abstract

An iterative spline interpolation method for a numerically-controlled machine tool device is disclosed. The non-uniform rational B-spline (NURBS) curve inputted to the numerically-controlled machine tool is interpolated with a constant step size providing the ability to maintain a controlled velocity to within a specified tolerance. In addition, the distance left to travel on the curve is obtained by a unique spline node-based approximation method providing accurate acceleration and deceleration control. The rational spline interpolation method provides significant reduction in the amount of data required to produce smoothly machined pieces while providing accurate machining of conic sections not possible by previous spline interpolation methods.


Find Patent Forward Citations

Jia, Ji. (1998). Method and system for spline interpolation, and their use in cnc (U.S. Patent No. 5726896). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5726896

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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