The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 10, 1998

Filed:

Feb. 02, 1996
Applicant:
Inventors:

Masunori Kawamura, Nagoya-shi, JP;

Setsuo Saitou, Aichi-gun, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B / ;
U.S. Cl.
CPC ...
351215 ; 351205 ;
Abstract

An ophthalmic measuring apparatus for eliminating the noise ingredient of the light without eliminating the scattered light by molecules in crystalline lens of the examiner, to achieve stable results of measurements, the ophthalmic measuring apparatus provided a laser beam irradiating optical system for emitting and converging a laser beam to an eye, and a scattered light detecting optical system for detecting a light scattered by molecules in a crystalline lens from the laser beam, and also provided measuring device for measuring a composition in the crystalline lens on the basis of the intensity of the light detected by the scattered light detecting optical system, of which a first polarizing filter is disposed in the scattered light detecting optical system so as to be consistent with the polarizing axis of the laser beam of the laser beam irradiating optical system.


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